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On the utility of a defect prediction model during hw/sw integration testing: A retrospective case study. In Proceedings of the 15th European Conference on Software Maintenance and Reengineering (CSMR’11)
Bereich: FB3
Tanyu , J. Ning, A. Hauptmann, B. Jin , P. Maaß . Electrical Impedance Tomography: A Fair Comparative Study on Deep Learning and Analytic-based Approaches. Zur Veröffentlichung eingereicht. online unter: h