Publications of the RG Callsen
semiconductor membrane by microphotoluminescence spectroscopy and Raman thermometry M. Elhajhasan, W. Seemann, K. Dudde, D. Vaske, I. Rousseau, T. F. K. Weatherley, J.-F. Carlin, R. Butté, N. Grandjean, N. H [...] Influence of Edge Roughness on the Optical Quality and Reducing Degradation with Supported Geometry W. Seemann, A. Kothe, C. Tessarek, G. Schmidt, S. Qiao, N. von den Driesch, J. Wiersig, A. Pawlis, G. Callsen