Veröffentlichungen
(Europe), Nuremberg, pp. 470‑476, June 2018 M. Hanf, C. Zorn, N. Kaminski, M. Domeij, F. Allerstam, B. Buono, J. Franchi, T. Neyer, “H³TRB Test on 1.2 kV SiC MOSFETs”, Proceedings of PCIM’18 (Europe), Nuremberg [...] Effekte, Universität Bremen, IALB, 2019 2018 2018 C. Zorn, F. Hoffmann, M. Hanf, N. Kaminski, F. Allerstam, A. Konstantinov, T. Neyer, “H³TRB Test on 650 V SiC JBS Diodes“, Proc. of ICSCRM’17, Washington DC [...] for SiC Power Devices in Systems and the Impact on Reliability Testing“, Proc. of ICSCRM’17, Washington DC, Mat. Sci. Forum, vol. 924, pp. 805-810, 2018 C. Bödeker, M. Adelmund, N. Kaminski, “The M-Shunt