Veröffentlichungen
(invited) , “Reliability Challenges for SiC Power Devices in Systems and the Impact on Reliability Testing“, Proc. of ICSCRM’17, Washington DC, Mat. Sci. Forum, vol. 924, pp. 805-810, 2018 C. Bödeker, M. [...] 75(22-27) 2015 2015 Christian Zorn and Nando Kaminski, Acceleration of temperature humidity bias (THB) testing on IGBT modules by high bias levels, in: Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th [...] Hong Kong, pages 245-248, IEEE, 2015 Christian Zorn and Nando Kaminski, Temperature–humidity–bias testing on insulated-gate bipolartransistor modules – failure modes and acceleration due to high voltag (2015)