Veröffentlichungen
Europe), 2019. Felix Hoffmann, Victor Soler, Andrei Mihaila and Nando Kaminski, Power Cycling Test on 3.3kV SiC MOSFETs and the Effects of Bipolar Degradation on the Temperature Estimation by VSD-Method , in [...] Effekte, Universität Bremen, IALB, 2019 2018 2018 C. Zorn, F. Hoffmann, M. Hanf, N. Kaminski, F. Allerstam, A. Konstantinov, T. Neyer, “H³TRB Test on 650 V SiC JBS Diodes“, Proc. of ICSCRM’17, Washington DC [...] (Europe), Nuremberg, pp. 470‑476, June 2018 M. Hanf, C. Zorn, N. Kaminski, M. Domeij, F. Allerstam, B. Buono, J. Franchi, T. Neyer, “H³TRB Test on 1.2 kV SiC MOSFETs”, Proceedings of PCIM’18 (Europe), Nuremberg