Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN
Tim Grieb, Florian F.Krause, Knut Müller-Caspary, Jan Philipp Ahl, Marco Schowalter , Oliver Oppermann, Joachim Hertkorn, Karl Engl, Andreas Rosenauer Ultramicroscopy (2022) 238, 113503 https://doi.org/10