Veröffentlichungen
Portoroz, 2006 Joost, M.; Peter, K.; Orlik, B.: ROBUST H8-CONTROL FOR MULTI-MASS SYSTEMS BASED ON A REDUCED MODEL, IFAC Mechatronics 2006, Heidelberg, 2006 Joost, M.; Peter, K.; Orlik, B.: Reduzierte [...] Conference on Silicon Carbide and Related Materials, ICSCRM 2019, Kyoto, Japan, 2019. Felix Hoffmann, Peter Friedrichs and Nando Kaminski, High Temperature High Humidity Reverse Bias (H³TRB) Test on 1200 V [...] International Symposium on Advanced Power Packaging, ISAPP 2019, Osaka, Japan, 2019. Sarah Rugen, Hauke Lutzen and Nando Kaminski, Characterization of the Gate Oxide of planar and trench SiC-MOSFETs , in Int