MAPEX Instrument Database
SEM
General information
Description
JSM-6510 Scanning Electron Microscope
Manufacturer
Jeol
Location
Fachbereich 2
IACK
Chemische Kristallographie fester Stoffe NW2 C3230
IACK
Chemische Kristallographie fester Stoffe NW2 C3230
Category
Electron Microscopy
MAPEX Category
Material Properties, Surface / Interface Characterization, Near- / Subsurface Properties
Keywords
SEM
Main Application
Scanning Electron Microscope
Features
SE and BE detectors; EDX detector for quantitative chemical analysis
Year of Fabrication
2011
Instrument specification
Specifications
- SE and BE detectors; EDX detector for quantitative chemical analysis.
- Jeol JSM-6510 Scanning Electron Microscope with W-emitter (maximum resolution 3 nm @ 30 kV).
- Detectors: Secondary electrons; backscattered electrons; Bruker X-Flash solid state detector for X-ray spectroscopy, enabling qualitative and quantitative analysis, analysis along line profiles and sample mapping.
Contact
Contact person
Lars Robben
Fachbereich 2 / IACK
NW2/C3051
Phone 63142
lrobben@uni-bremen.de
Principal Investigator
Gesing, Thorsten