MAPEX Instrument Database
Prof. Falta NW 1 M0060
Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined). The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean. For in-situ sample treatment, . The maximum scan area of the STM is 1000 nm X 1000 nm. The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.