Zum Hauptinhalt springen

MAPEX Instrument Database

(S)TEM

General information

Description
Titan 80-300 ST
Manufacturer
FEI
Location
Fachbereich 1
IFP
AG Rosenauer NW1 O0050
Category
Diffraction, Microscopy, Spectroscopy, Electron Microscopy
MAPEX Category
Dimensional Properties, Surface / Interface Characterization, Material Properties
Keywords
HR(S)TEM, EELS, EFTEM, EDX, Nano beam electron diffraction, NBED, TEM
Measured Quantity
Morphological quantities, Elemental distribution, Strain distribution
Main Application
(Scanning) transmission electron microscopy
Features
Aberration corrector for imaging lens
Year of Fabrication
2007

Instrument specification

Specifications

Electron energy loss spectrometer, EDX detector, HAADF detector, Tomography holder, heating(RT-1000°C)/cooling(lN2-70°C) holder, electron biprism

 

Usage regulation

Contact

Contact person

Thorsten Mehrtens
Fachbereich 1
NW1, M4190
Phone 0421/218/62273
mehrtens@ifp.uni-bremen.de
http://www.ifp.uni-bremen.de/electron-microscopy/

Marco Schowalter
Fachbereich 1
NW1, M4180
Phone 0421/218/62263
schowalter@ifp.uni-bremen.de
http://www.ifp.uni-bremen.de/electron-microscopy/

Principal Investigator
Rosenauer, Andreas
Aktualisiert von: MAPEX