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MAPEX Instrument Database

FastScanning AFM

General information

Description
FastScanning AFM
Manufacturer
Bruker
Location
Fachbereich 5
Mineralogy GEO 3220
Category
Microscopy, Surface Analytics
MAPEX Category
Surface / Interface Characterization, Material Properties
Keywords
surface topography, surface chemistry, surface reaction kinetics, surface films, roughness
Measured Quantity
surface heights, surface forces, mechanical properties
Main Application
Analysis of chemical kinetics during dissolution/ corrosion, growth, and adsorption of materials
Features
High-speed analysis of reacting surfaces
Year of Fabrication
2015

Instrument specification

Specifications
  • Scan head for fast measurements (100 Hz), FOV =  30 µm x 30 µm
  • low noise level < 200 pm RMS
  • second scan head for large FOVs up to 80 µm x 80 µm
  • measurement modes include contact, tapping, phase imaging, force spectroscopy, and electrochemical potential

Contact

Contact person

Andreas Lüttge
Fachbereich 5
GEO
Phone 0421-218-65233
andrluet@uni-bremen.de
www.marum.de/Andreas_Luettge.html

Cornelius Fischer
Phone +49 351 260 4660
c.fischer@hzdr.de
https://www.hzdr.de/db/!ContMan.Visi.Card?pUser=124707&pNid=0

Principal Investigator
Lüttge, Andreas
Aktualisiert von: MAPEX