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MAPEX Instrument Database

XRM

General information

Description
3D X-ray microscope, Xradia 520 Versa
Manufacturer
ZEISS
Category
3D X-ray microscopy
MAPEX Category
Material Properties, Dimensional Properties, Surface / Interface Characterization
Keywords
X-ray, 3D-microscope, Non-destructive testing, Computer Tomograph, CT
Measured Quantity
True 3D spatial arrangement of X-ray absorption in the sample
Main Application
Non-destructive testing, characterization of the 3D microstructure of industrial or geologic materials, biologic tissues etc.
Features
high contrast, 3D crystallographic grain information, in-situ and 4D (time-dependent) experiments
Year of Fabrication
2016

Instrument specification

Specifications

3D X-ray microscope comes with:

  • a two-stage geometric and optical magnification based on high resolution optics, (0.4X, 4X and 20X objectives) to provide submicron resolution at large working distances, for a large range of sample sizes (see attached file)
  • diffraction contrast tomography for unlocking crystallographic information (mapping of grain orientations)
  • deliver flexible, high contrast imaging for challenging materials—low atomic number (low Z) materials, soft tissue, polymers, fossilized organisms encased in amber, and other materials of low contrast (see attached file)
  • in-situ-stage to characterize the microstructure of materials in native-like environments (under variation of pressure, tensile or temperature) as well as the evolution of properties over time (4D)

Additional information and examples

Check contact in Usage regulation

Newsletter supplement:
06: X-RAY MICROSCOPY (XRM)

Contact

Contact person

Wolf-Achim Kahl
MAPEX Center for Materials and Processes
TAB / 3.35
Phone 0049-421-21864581
wakahl@uni-bremen.de

Principal Investigator
Colombi Ciacchi, Lucio
Aktualisiert von: MAPEX