Zum Hauptinhalt springen

MAPEX Instrument Database

X-Ray Lab

General information

Category
Diffraction
MAPEX Category
Near- / Subsurface Properties, Material Properties
Keywords
---
Measured Quantity
residual stresses, phase analyses, determination of retained austenite amount, texture measurements

Instrument specification

Specifications
  • 12 Chi-diffractometer, therefrom 3 with position sensitive detector (10 with Cr-Kα, 2 with Cu-Kα radiation)
  • 1 ETA diffractometer with position sensitive detector for phase analyses, residual stress and texture measurements at large samples (Cr-kα radiation, other radiations also possible)
  • 1 diffractometer for high resolution phase analyses (Cu-Kα with secondary monochromator)
  • 1 diffractometer with eulerian cradle for phase analyses, residual stress and texture measurements (possible radiation: Mo-kα, Cu- Kα, Co-kα, Cr-kα)
  • 1 diffractometer for rapid in situ investigations during heat treatment with rotating anode, position sensitive detector and focussing polycapillary (possible radiation: Cu- Kα, Co-kα, Cr-kα)
  • 1 diffractometer with solid-state detector for high resolution phase analyses and residual stress measurements (rotating anode, possible radiation: Cu- Kα, Co-kα, Cr-kα)
  • 1 mobile diffractometer with Cr-Kα or Cu-kα radiation for residual stress measurements at very large samples and measurements on site
  • 3MA-II equipment for micromagnetic measurements of residual stresses, grinding burn investigations, etc.
  • Hole drilling equipment for semi-destructive residual stress measurements

Contact

Contact person

Jérémy Epp
IWT
Phone 0421 218-51335
epp@iwt-bremen.de
www.iwt-bremen.de

Principal Investigator
Zoch, Hans-Werner
Aktualisiert von: MAPEX