2016 - 2019
Europe), 2019. Felix Hoffmann, Victor Soler, Andrei Mihaila and Nando Kaminski, Power Cycling Test on 3.3kV SiC MOSFETs and the Effects of Bipolar Degradation on the Temperature Estimation by VSD-Method , in [...] Hanf, C. Zorn, N. Kaminski, M. Domeij, F. Allerstam, B. Buono, J. Franchi, T. Neyer, “H³TRB Test on 1.2 kV SiC MOSFETs”, Proceedings of PCIM’18 (Europe), Nuremberg, pp. 1506‑1511, June 2018 2017 C. Zorn [...] ungen bei Feuchtetests mit GaN-Bauelementen , Halbleiterkolloquium, Freiburg i.Br., 2019. Sarah Rugen, Gate-Oxide von SiC-MOSFETs , Leistungselektronik-Nord Kolloquium, Magdeburg, 2019. Alexander Brunko