Thermische Charakterisierung von Halbleitermaterialien
nitride semiconductor membrane by microphotoluminescence spectroscopy and Raman thermometry MahmoudElhajhasan, Wilken Seemann, Katharina Dudde, Daniel Vaske, Gordon Callsen, Ian Rousseau, Thomas F. K. [...] III-nitride semiconductor membrane by micro-photoluminescence spectroscopy and Raman thermometry M. Elhajhasan, W. Seemann, K. Dudde, D. Vaske, G. Callsen, I. Rousseau, T. F. K. Weatherly, J.-F. Carlin, R.