Publikationen
analysis low-energy electron diffraction C. Klein, T. Nabbefeld, H. Hattab, D. Meyer, G. Jnawali, M. Kammler, F.J. Meyer zu Heringdorf, A. Golla-Franz, B.H. Müller, Th. Schmidt, M. Henzler, and M. Horn-von [...] 4H-SiC(0001) during in-situ surface preparation and its influence on graphene properties J. Hassan, A. Meyer, S. Cakmakyapan, O. Kazar, J.I. Flege, J. Falta, E. Ozbay, and E. Janzén Materials Science Forum, [...] Epitaxial Graphene Grown on Si-Face SiC S. Watcharinyanon, L.I. Johansson, C. Xia, J.I. Flege, A. Meyer, J. Falta, and C. Virojanadara Graphene, 2, (2013) 66-73 DOI: http/dx.doi.org/10.4236/graphene.2013
